SAXS Research at NSRRC
نویسنده
چکیده
Small-angle X-ray scattering (SAXS), a scattering tool of atomic spatial resolution and high penetration power, provides a non-destructive scattering tool in structural characterization for surfaces, interfaces, as well as bulks, and is an decent complimentary technique to the direct imaging tools such as the SEM, TEM, and AFM in nanostructure research. Capable in probing structural information (electron density fluctuations) in a wide range of length scales spanning from sub-nanometer to submicron, SAXS has been employed regularly in many fields where nanostructure and/or mesomorphous structure take a decisive role in determining phases, functions, and/or performances of devices.
منابع مشابه
X-ray beamlines for structural studies at the NSRRC superconducting wavelength shifter.
Using a superconducting-wavelength-shifter X-ray source with a photon flux density of 10(11)-10(13) photons s(-1) mrad(-1) (0.1% bandwidth)(-1) (200 mA)(-1) in the energy range 5-35 keV, three hard X-ray beamlines, BL01A, BL01B and BL01C, have been designed and constructed at the 1.5 GeV storage ring of the National Synchrotron Radiation Research Center (NSRRC). These have been designed for str...
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